Description
ICP-MS/MS (Inductively coupled plasma mass spectrometer): Metal ion detection;
Tropel(Flatness measurement equipment):Substrate morphology detection, TTV, Bow, Warp., etc.;
Napson(Resistance meter): Substrate resistance measurement;
CANDELA 8520(Defect detector): substrate defect detection, scratch, particles, pit, micropipe, etc.
- Semiconductor
- ingot
- SiC
- silicon carbide wafer/substrate
- detection services
More about
QINGDAO JZLEAP Semiconductor Co.,Ltd.
100-200
Employees
500K - 1M
Sales volume (USD)
80%
% Export sales
2021
Year
Established
Business type
- Industry / Manufacturer
Keywords
- Semiconductor materials
- ingots
- silicon carbide
- substrates
Contact and location
-
Alice ********
-
+86 53********
-
青岛 / 山东 | China